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    • Interlaced zone plate optics for hard X-ray imaging in the 10 nm range 

      Mohacsi I; Vartiainen I; Rosner B; Guizar-Sicairos M; Guzenko VA; McNulty I; Winarski R; Holt MV; David C (Springer Nature, 2017)
      Multi-keV X-ray microscopy has been particularly successful in bridging the resolution gap between optical and electron microscopy. However, resolutions below 20 nm are still considered challenging, as high throughput ...