Interferometric imaging of reflective micro-objects in the presence of strong aberrations
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2020Unique identifier
10.1364/OE.383451Metadata
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llina, Elena. Nyman, Markus. Monda I, Tanmay. Kaivola, Matti. Setälä, Tero. Shevchenko, Andriy. (2020). Interferometric imaging of reflective micro-objects in the presence of strong aberrations. Optics express, 28 (2) , 1817-1826. 10.1364/OE.383451.Rights
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Abstract
Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.
