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dc.contributor.authorSahlström, Teemu
dc.contributor.authorPulkkinen, Aki
dc.contributor.authorTick, Jenni
dc.contributor.authorLeskinen, Jarkko
dc.contributor.authorTarvainen, Tanja
dc.date.accessioned2020-03-20T11:00:41Z
dc.date.available2020-03-20T11:00:41Z
dc.date.issued2020
dc.identifier.urihttps://erepo.uef.fi/handle/123456789/8066
dc.description.abstractPhotoacoustic tomography is an imaging modality based on the photoacoustic effect caused by the absorption of an externally introduced light pulse. In the inverse problem of photoacoustic tomography, the initial pressure generated through the photoacoustic effect is estimated from a measured photoacoustic time-series utilizing a forward model for ultrasound propagation. Due to the ill-posedness of the inverse problem, errors in the forward model or measurements can result in significant errors in the solution of the inverse problem. In this work, we study modeling of errors caused by uncertainties in ultrasound sensor locations in photoacoustic tomography using a Bayesian framework. The approach is evaluated with simulated and experimental data. The results indicate that the inverse problem of photoacoustic tomography is sensitive even to small uncertainties in sensor locations. Furthermore, these uncertainties can lead to significant errors in the estimates and reduction of the quality of the photoacoustic images. In this work, we show that the errors due to uncertainties in ultrasound sensor locations can be modeled and compensated using Bayesian approximation error modeling.
dc.language.isoenglanti
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)
dc.relation.ispartofseriesIEEE transactions on medical imaging
dc.relation.urihttp://dx.doi.org/10.1109/TMI.2020.2966297
dc.rightsIn copyright 1.0
dc.subjectphotoacoustic tomography (PAT)
dc.subjectinverse problems
dc.subjectBayesian methods
dc.subjecterror modeling
dc.titleModeling of Errors due to Uncertainties in Ultrasound Sensor Locations in Photoacoustic Tomography
dc.description.versionfinal draft
dc.contributor.departmentDepartment of Applied Physics, activities
uef.solecris.id69202483en
dc.type.publicationTieteelliset aikakauslehtiartikkelit
dc.relation.doi10.1109/TMI.2020.2966297
dc.description.reviewstatuspeerReviewed
dc.format.pagerange2140-2150
dc.relation.issn0278-0062
dc.relation.issue6
dc.relation.volume39
dc.rights.accesslevelopenAccess
dc.type.okmA1
uef.solecris.openaccessEi
dc.rights.copyright© IEEE
dc.type.displayTypearticleen
dc.type.displayTypeartikkelifi
dc.rights.urlhttps://rightsstatements.org/page/InC/1.0/


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